1.

国際会議録
国際会議録
1. Characterization of CaF2 substrates for VUV fluoride coatings
Hultaker, A. ; Gliech, S. ; Gessner, H. ; Duparre, A.
出版情報: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.119-126,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5250
2.

国際会議録
国際会議録
2. 157- and 193-nm scatter, R, and T measurement technique
Gliech, S. ; Gessner, H. ; Hultaker, A. ; Duparre, A.
出版情報: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.137-145,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5250
3.

国際会議録
国際会議録
3. System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm
Gliech, S. ; Gessner, H. ; Duparre, A.
出版情報: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.452-457,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4932