1.

国際会議録
国際会議録
1. Electron microscopy techniques for the assessment of localised stress distributions in semiconductors
Vanhellemont, J. ; Janssens, K.G.F. ; Frabboni, S. ; Balboni, R. ; Armigliato, A.
出版情報: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.173-192,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-30
2.

国際会議録
国際会議録
2. VISIBLE PHOTOLUMINESCENCE FROM SILICON NANOCONSTRICTIONS FORMED BY HEAVY HYDROGEN IMPLANTATION AND ANNEALING TREATMENTS
Pavesi, L. ; Bisero, D. ; Corni, F. ; Frabboni, S. ; Tonini, R. ; Ottaviani, G.
出版情報: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.157-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 358
3.

国際会議録
国際会議録
3. Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors
Vanhellemont, J. ; Janssens, K. G. F. ; Frabboni, S. ; Smeys, P. ; Balboni, R. ; Armigliato, A.
出版情報: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.479-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 406
4.

国際会議録
国際会議録
4. Analysis of Localised Strains in Crystals by Convergent Beam Electron Diffraction
Armigliato, A. ; Balboni, R. ; Benedetti, A. ; Frabboni, S.
出版情報: High-pressure crystallography.  pp.277-294,  2004.  Dordrecht.  Kluwer Academic Publishers
シリーズ名: NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号: 140
5.

国際会議録
国際会議録
5. Physical-Chemical Evolution of Hf-Aluminates Upon Thermal Treatments
Crivelli, B. ; Alessandri, M. ; Alberici, S. ; Brazzelli, D. ; Elbaz, A. C. ; Frabboni, S. ; Ghidini, G. ; Maes, J. W. ; Ottaviani, G. ; Pavia, G. ; Wiemer, C.
出版情報: CMOS front-end materials and process technology : symposium held April 22-24, 2003, San Francisco, California, U.S.A..  pp.65-72,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 765
6.

国際会議録
国際会議録
6. Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors
Vanhellemont, J. ; Janssens, K. G. F. ; Frabboni, S. ; Smeys, P. ; Balboni, R. ; Armigliato, A.
出版情報: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.435-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 405
7.

国際会議録
国際会議録
7. Influence of the First Preparation Steps on the Properties of GaN Layers Grown on 6H-SiC by MBE
Lantier, R. ; Rizzi, A. ; Guggi, D. ; Luth, H. ; Neubauer, B. ; Gerthsen, D. ; Frabboni, S. ; Coli, G. ; Cingolani, R.
出版情報: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G3.50.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 537
8.

国際会議録
国際会議録
8. Determination of Bulk Mismatch Values in Heterostructures by TEM/CBED
Armigliato, A. ; Balboni, R. ; Frabboni, S.
出版情報: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.467-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 405