1.

国際会議録
国際会議録
1. First use of a high-sensitivity active pixel sensor array as a detector for electron microscopy
Xuong, N.-H. ; Milazzo, A.-C. ; LeBlanc, P. ; Duttweiler, F. ; Bouwer, J. ; Peltier, S. ; Ellisman, M. ; Denes, P. ; Bieser, F. ; Matis, H.S. ; Wieman, H. ; Kleinfelder, S.
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications V : 19-21 January, 2004, San Jose, California, USA.  pp.242-249,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5301
2.

国際会議録
国際会議録
2. A new direct detection camera system for electron microscopy [6068-26]
Li, S. ; Bouwer, J. ; Duttweiler, F. ; Ellisman, M. ; Jin, L. ; Leblanc, P. ; Milazzo, A. ; Peltier, S. ; Xuong, N. ; Kleinfeldedr, S.
出版情報: Sensors, Cameras, and Systems for Scientific/Industrial Applications VII.  pp.60680O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6068
3.

テクニカルペーパー
テクニカルペーパー
3. PHOTOMETRIC AND SPECTROSCOPIC GAMMA-RAY OBSERVATIONS OF SOLAR TRANSIENT PHENOMEMA USING LONG DURATION BALLOONS
Pelling, M. R. ; Duttweiler, F. ; Lin, R. P. ; Levedahl, W. K. ; Primbsch, H. ; Curtis, D. W. ; Burley, K. C.
出版情報: NASA Technical Reports.  (NASA-CP-2376-Vol-5),  pp.1-4,  1985.  National Aeronautics and Space Administration