1.

国際会議録
国際会議録
1. Scatter analysis of optical componets from 193 nm to 13.5 nm [5878-30]
Schroeder, S. ; Kamprath, M. ; Gliech, S. ; Duparre, A.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.58780T-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5878
2.

国際会議録
国際会議録
2. Surface texture investigation of ultra-precision optical componets [5878-40]
Schroder, s. ; Ratteit, J. ; Gliech, S. ; Duparre, A.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.587813-587813,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5878
3.

国際会議録
国際会議録
3. Nanostructure and optical properties of fluoride films for high-quality DUV/VUV optical components [5963-27]
Schroder, S. ; Uhlig, H. ; Duparre, A. ; Kaiser, N.
出版情報: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.59630R-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5963
4.

国際会議録
国際会議録
4. Investigating the ArF laser stability of CaF2 at elevated fluences [5878-14]
Burkert, A.. ; Muhlig, C. ; Triebel, W. ; Keutel, D. ; Natura, U. ; Parthier, L. ; Gliech, S. ; Schroder, S. ; Duparre, A.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA.  pp.58780E-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5878
5.

国際会議録
国際会議録
5. Characterization of CaF2 substrates for VUV fluoride coatings
Hultaker, A. ; Gliech, S. ; Gessner, H. ; Duparre, A.
出版情報: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.119-126,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5250
6.

国際会議録
国際会議録
6. Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter
Flemming, M. ; Hultaker, A. ; Reihs, K. ; Duparre, A.
出版情報: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.56-63,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5250
7.

国際会議録
国際会議録
7. VUV light scattering measurements of substrtes and thin film coatings
Hultaker, A. ; Gliech, S. ; Benkert, N. ; Duparre, A.
出版情報: Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA.  pp.115-122,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5188
8.

国際会議録
国際会議録
8. Scanning force microscopy for optical surface metrology [5965-10]
Flemming, M. ; Roder, K. ; Duparre, A.
出版情報: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.59650A-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5965
9.

国際会議録
国際会議録
9. Sensitive and flexible light scatter techniques from the VUV to IR regions [5965-48]
Schroder, S. ; Gliech, S. ; Duparre, A.
出版情報: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.59651B-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5965
10.

国際会議録
国際会議録
10. Low-loss gratings for next-generation gravitational wave detectors [5870-18]
Clausnitzer, T. ; Kley, E.-B. ; T-nnermann, A. ; Bunkowski, A. ; Burmeister, O. ; Danzmann, K. ; Schnabel, R. ; Duparre, A. ; Gliech, S.
出版情報: Advances in thin film coatings for optical applications II : 1-2 August 2005, San Diego, California, USA.  pp.58700J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5870