1.

国際会議録
国際会議録
1. Optical anisotropy of GaN/sapphire studied by generalized ellipsometry and Raman scattering
Yan,C. ; Yao,H.W. ; Hove,J.M.Van ; Wowchak,A.M. ; Chow,P.P. ; Zavada,J.M.
出版情報: Light-emitting diodes : research, manufacturing, and applications III : 27-28 January 1999, San Jose, California.  pp.73-84,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3621
2.

国際会議録
国際会議録
2. Optical properties of AIN/sapphire grown at high and low temperatures studied by variable angle spectroscopic ellipsometry and micro Raman scattering
Yan,C.H. ; Yao,H.W. ; Abare,A.C. ; DenBaars,S.P. ; Klaassen,J.J. ; Rosamond,M.F. ; Chow,P.P. ; Zavada,J.M.
出版情報: Light-emitting diodes : research, manufacturing, and applications IV : 26-27 January 2000, San Jose, California.  pp.113-123,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3938
3.

国際会議録
国際会議録
3. AlGaN Schottky diodes for short-wavelength UV applications
Chow,P.P. ; Klaassen,J.J. ; Vest,R.E. ; VanHove,J.M. ; Wowchak,A.M. ; Polley,C.
出版情報: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.230-237,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4288
4.

国際会議録
国際会議録
4. Group ?-nitride materials for ultraviolet detection applications
Chow,P.P. ; Klaassen,J.J. ; VanHove,J.M. ; Wowchak,A.M. ; Polley,C. ; King,D.
出版情報: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.295-303,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3948