Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.552-559, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, J. ; Han, I.K. ; Choi, W.J. ; Brini, J. ; Chovet, A.
出版情報:
Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China. pp.34-42, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor process and device performance modeling : symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A.. pp.239-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Nam, H. ; Yang, H. -S. ; Lee, J. ; Chovet, A. ; Szentpali, B. ; Kim, E.
出版情報:
Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA. pp.200-207, 2005. Bellingham, Washington. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Song, J. D. ; Choi, W. J. ; Han, I. K. ; Cho, W. J. ; Lee, J. I. ; Yu, Y. B. ; Pyun, C. H. ; Kim, J. H. ; Song, J. I. ; Chovet, A.
出版情報:
Noise and Information in Nanoelectronics, Sensors, and Standards II. pp.432-440, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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