1.

国際会議録
国際会議録
1. Combined polarizing interferometer and optical beam deflection system for MEMS characterization
Jenkins,D.F.L. ; Clegg,W.W. ; Liu,X. ; Tunstall,G. ; Cattan,E. ; Remiens,D. ; Liu,B.
出版情報: Novel optical systems design and optimization IV : 1-2 August , 2001, San Diego, USA.  pp.15-25,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4442
2.

国際会議録
国際会議録
2. Characterization by X-ray diffraction of PZT(Pb(ZrxTi1-x)O3)thin films on Pt/TiN/BPSG/Si substrate
Cattan,E. ; Varniere,F. ; Chevrier,G.
出版情報: EPDIC 3 : proceedings of the Third European Powder Diffraction Conference, held September 25 - 28, 1993, in Vienna, Austria.  Part2  pp.379-384,  1994.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 166-169