Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.265-276, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Automatic target recognition XIV : 13-15 April 2004, Oriando, Florida, USA. pp.15-29, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.309-319, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.277-287, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XIII : 2 April, 2002, Orlando, USA. pp.1-8, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Automatic target recognition XIII : 22-24 April 2003, Oriando, Florida, USA. pp.228-241, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Kostrzewski, A.A. ; Savant, G.D. ; Shnitser, P.I. ; Piliavin, M.A. ; Sandomirsky, S. ; Vasiliev, A.A. ; Casasent, D.P.
出版情報:
Fundamental problems of optoelectronics and microelectronics : 30 September-4 october, 2002, Vladivostok, Russia. pp.129-139, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Kostrzewski, A.A. ; Savant, G. ; Shnitser, P. ; Piliavin, M. ; Sandomirsky, S. ; Vasiliev, A.A. ; Casasent, D.P.
出版情報:
Current research on holography and interferometric methods for measurement of object properties : 2000-2002. pp.127-138, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.171-178, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.1-12, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering