1.

国際会議録
国際会議録
1. Effect Of Metallic Contamination On Interface Properties And Oxide Reliability
Oborina, Elena ; Campbell, Scott ; Hoff, Andrew M. ; Gilbert, Richard ; Persson, Eric ; Simpson, Darrell
出版情報: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.651-656,  2002.  Warrendale.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 716
2.

国際会議録
国際会議録
2. Digital holographic data storage in photopolymer systems
Dhar, Lisa ; Curtis, Kevin ; Schilling, Marcia ; Schnoes, Melinda ; Tackitt, Michael ; Campbell, Scott ; Wilson, William ; Hill, Adrian
出版情報: Advanced optical memories and interfaces to computer storage : 22-24 July 1998, San Diego, California.  pp.40-42,  1998.  Bellingham, Wash., USA.  SPIE
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3468