1.

国際会議録
国際会議録
1. Characterization of Ti/Al Ohmic Contacts to p-Type 4H-SiC Using Cathodoluminescence and Auger Electron Spectroscopies
Gao, M. ; Tumakha, S.P. ; Onishi, T. ; Tsukimoto, S. ; Murakami, M. ; Brillson, L.J.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.891-894,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Nanoscale Deep Level Defect Correlation with Schottky Barriers in 4H-SiC/Metal Diodes
Tumakha, S.P. ; Porter, L.M. ; Ewing, D.J. ; Wahab, Q. ; Ma, X.Y. ; Sudarshan, T.S. ; Brillson, L.J.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.907-910,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
3.

国際会議録
国際会議録
3. A Study of Inhomogeneous Schottky Diodcs on n-Type 4H-SiC
Ewing, D.J. ; Wahab, Q. ; Tumakha, S.P. ; Brillson, L.J. ; Ma, X.Y. ; Sudarshan, T.S. ; Porter, L.M.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.911-914,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
4.

国際会議録
国際会議録
4. CAN OXIDATION AND OTHER TREATMENTS HELP US UNDERSTAND THE NATURE OF LIGHT-EMITTING POROUS SILICON?
Fauchet, P.M. ; Ettedgui, E. ; Raisanen, A. ; Brillson, L.J. ; Seiferth, F. ; Kurinec, S.K. ; Gao, Y. ; Peng, C. ; Tsybeskov, L.
出版情報: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.271-276,  1993.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 298
5.

国際会議録
国際会議録
5. Microcathodoluminescence Characterization of III-Nitride Heterojunctions and Devices *
Brillson, L.J. ; Jessen, G.H. ; Goss, S.H. ; Sun, X.L. ; Bradley, S.T. ; White, B.D. ; Smith, P.E. ; Levin, T.E. ; Young, A.P. ; Look, D.C. ; Van Nostrand, J.E. ; Via, G.D. ; Gillespie, J.K. ; Dettmer, R.W. ; Sewell, J.S. ; Fitch, R.
出版情報: State-of-the-art program on compound semiconductors XXXVIII and wide bandgap semiconductors for photonic and electronic devices and sensors III : proceedings of the international symposia.  pp.229-234,  2003.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2003-4
6.

国際会議録
国際会議録
6. DEEP LEVEL LUMINESCENCE MEASUREMENTS OF MBE CdTe GROWTH QUALITY AND PROCESSING
Shaw, J.L. ; Brillson, L.J. ; Sivananthan, S. ; Faurie, J.P.
出版情報: Properties of II-VI semiconductors : bulk crystals, epitaxial films, quantum well structures, and dilute magnetic systems : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A..  pp.59-62,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 161
7.

国際会議録
国際会議録
7. 4H- to 3C-SiC Polytypic Transformation during Oxidation
Okojie, R.S. ; Xhang, M. ; Pirouz, P. ; Tumakha, S. ; Jessen, G. ; Brillson, L.J.
出版情報: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.451-454,  2002.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 389-393
8.

国際会議録
国際会議録
8. Surface Morphology and Chemistry of 4H- and 6H-SiC after Cyclic Oxidation
Okojie, R.S. ; Lukco, D. ; Keys, L. ; Tumakha, S. ; Brillson, L.J.
出版情報: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1101-1104,  2002.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 389-393
9.

国際会議録
国際会議録
9. *REACTIONS AND INTERDIFFUSION AT III-V COMPOUND SEMICONDUCTOR-METAL INTERFACES
Brillson, L.J.
出版情報: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.327-334,  1985.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 54
10.

国際会議録
国際会議録
10. INTENSE ROOM TEMPERATURE LIGHT EMISSION IN POROUS SILICON: FROM LESS THAN 450 orn TO BEYOND 1.5 u.m
Fauchet, P.M. ; Peng, C. ; Tsybeskov, L. ; Vandyshev, J. ; Dubois, A. ; Raisanen, A. ; Orlowski, T.E. ; Brillson, L.J. ; Fouquet, J.E. ; Dexheimer, S.L. ; Rehm, J.M. ; McLendon, G.L. ; Ettedgui, E. ; Gao, Y. ; Seiferth, F. ; Kurinec, S.K.
出版情報: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.499-510,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-10