1.

国際会議録
国際会議録
1. Room-temperature single-hole silicon memory cell
Bagraev,N.T. ; Bouravleuv,A.D. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Rykov,S.A.
出版情報: Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering.  pp.125-128,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4348
2.

国際会議録
国際会議録
2. Pair charge correlations in silicon nanostructures
Bagraev,N.T. ; Bouravleuv,A.D. ; Gasumyants,V.E. ; Gehihoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naeser,A.F.A. ; Romanov,V.V. ; Rykov,S.A. ; Vladimirskaya,E.V.
出版情報: International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia.  pp.105-111,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3687
3.

国際会議録
国際会議録
3. Optical and magnetic properties for erbium-related centers in self-assembled silicon nanostructures
Bagraev,N.T. ; Bouravleuv,A.D. ; Gehlhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Mezdrogina,M.M. ; Naeser,A. ; Romanov,V.V. ; Rykov,S.A.
出版情報: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.129-134,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4064
4.

国際会議録
国際会議録
4. Single-electron transport through the Anderson center on Si(100)surface
Bagraev,N.T. ; Bouravleuv,A.D. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Mikoushkin,V.M. ; Nikonov,S.Yu. ; Rykov,S.A.
出版情報: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.135-139,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4064