1.

国際会議録
国際会議録
1. ON THE ELECTRICAL ACTIVITY OF OXYGEN-RELATED EXTENDED DEFECTS IN SILICON
Vanhellemont, J. ; Simoen, E. ; Bosman, G. ; Claeys, C. ; Kaniava, A. ; Gaubas, E. ; Blondeel, A. ; Clauws, P.
出版情報: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.670-683,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-10
2.

国際会議録
国際会議録
2. Low frequency noise and random telegraph signal in a multiple quantum well infrared photodetector
Kore, L. ; Bosman, G.
出版情報: Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.199-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 607
3.

国際会議録
国際会議録
3. Image guided noise tomography for increased specificity of magnetic resonance imaging
Reza, S. ; Bosman, G. ; Duensing, G. R. ; Huang, F. ; Saylor, C.
出版情報: Fluctuations and noise in biological, biophysical, and biomedical systems III : 24-26 May, 2005, Austin, Texas, USA.  pp.125-132,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5841
4.

国際会議録
国際会議録
4. Correlation Noise Measurements and Modeling of Nanoscale MOSFETs
Lee, J. ; Bosman, G.
出版情報: Advanced experimental methods for noise research in nanoscale electronic devices.  pp.153-160,  2004.  Dordrecht.  Kluwer Academic Publishers
シリーズ名: NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号: 151
5.

国際会議録
国際会議録
5. Computer simulation and reverse engineering of trap-assisted generation-recombination noise in advanced silicon MOSFETs (Invited Paper)
Bosman, G. ; Hou, F.-C. ; Martin, D.O. ; Sanchez, J.E.
出版情報: Noise in Devices and Circuits.  pp.232-236,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5113