1.

国際会議録
国際会議録
1. Noncontact NDE of microscopic surface-breaking cracks using laser generated and detected ultrasonic surface waves
Cooney, A. ; Blackshire, J.L.
出版情報: Nondestructive evaluation and health monitoring of aerospace materials and composites III : 16-17 March 2004, San Diego, California, USA.  pp.29-40,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5393
2.

国際会議録
国際会議録
2. Optical interferometric measurements of the static/dynamic response characteristics of MEMS ultrasonic transducers
Blackshire, J.L. ; Sathish, S.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.172-182,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5045
3.

国際会議録
国際会議録
3. In situ measurements of stress-corrosion crack growth using laser ultrasonics
Kacmar, C. ; Blackshire, J.L.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.213-222,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5045
4.

国際会議録
国際会議録
4. Microscopic NDE of hidden corrosion
Blackshire, J.L. ; Hoffmann, J. ; Kropas-Hughes, C.V. ; Tansel, I.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.93-103,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5045
5.

国際会議録
国際会議録
5. Micro- and nano-NDE systems for aircraft: great things in small packages (Invited Paper)
Malas, J.C. ; Kropas-Hughes, C.V. ; Blackshire, J.L. ; Moran, T. ; Peeler, D. ; Frazier, W.G. ; Parker, D.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.28-36,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5045
6.

国際会議録
国際会議録
6. Interferometric assessment of laser-induced damage to semiconductors
Blackshire, J.L. ; Zakel, A. ; Guha, S.
出版情報: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.  pp.434-443,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4932
7.

国際会議録
国際会議録
7. Microcharacterization of MEMS ultrasonic transducers using laser interferometry
Blackshire, J.L. ; Sathish, S.
出版情報: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.184-193,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4703
8.

国際会議録
国際会議録
8. Laser processing of micro-cracks for structural life extension
Blackshire, J.L. ; Dosser, L. ; Hix, K.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.168-178,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5392
9.

国際会議録
国際会議録
9. Characterization of microscopic surface breaking cracks using the near-field intensification of nondestructive laser-generated surface waves
Cooney, A.T. ; Blackshire, J.L.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.158-167,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5392
10.

国際会議録
国際会議録
10. High-resolution nondestructive evaluation at the Center for Materials Diagnosis
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.256-265,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5392