1.

国際会議録
国際会議録
1. Novel technique for reliability testing of silicon integrated circuits
LeMinh,P. ; Wallinga,H. ; Woerlee,P.H. ; Berg,A.van den ; Holleman,J.
出版情報: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK.  pp.185-190,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4406
2.

国際会議録
国際会議録
2. New design methodologies in<III>-oriented silicon wafers
Oosterbroek,R.E. ; Berenschot,J.W. ; Nijdam,A.J. ; Pandraud,G. ; Elwenspoek,M.C. ; Berg,A.van den
出版情報: Micromachining and microfabrication process technology V : 20-22 September, 1999, Santa Clara, California.  pp.384-394,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3874
3.

国際会議録
国際会議録
3. Technologies and microstructures for separation techniques in chemical analysis
Spiering,V.L. ; Lammerink,T.S.J. ; Jansen,H.V. ; Fluitman,J.H.J. ; Berg,A.van den
出版情報: Micromachined devices and components II : 14-15 October 1996, Austin, Texas.  pp.91-100,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2882
4.

国際会議録
国際会議録
4. Micromachined pipettes integrated in a flow channel for single DNA molecule study by optical trapping
Rusu,C.R. ; Oever,R.van't ; Boer,M.J.de ; Jansen,H.V. ; Berenschot,E. ; Elwenspoek,M.C. ; Bennink,M.L. ; Kanger,J.S. ; Grooth,B.G.de ; Greve,J. ; Brugger,J. ; Berg,A.van den
出版情報: Micro- and nanotechnology for biomedical and environmental applications : 26-27 January 2000, San Jose, California, USA.  pp.41-49,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3912