Sigrist, N. ; Redding, D. C. ; Lou, J. Z. ; Zhang, Y. ; Basinger, S.
出版情報:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.596524-596526, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
The next generation space telescope science drivers and technological challenges : proceedings 34th Liège International Astrophysics Colloquium , Liége, Belgium, 15-18 June 1998. pp.285-294, 1998. Noordwijk,TheNetherlands. ESA Publications Division