1.

国際会議録
国際会議録
1. Mapping frazil and pancake sea ice from SAR imagery
Baraldi,A. ; Parmiggiani,F.
出版情報: SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain.  pp.144-152,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4173
2.

国際会議録
国際会議録
2. Accuracy of imaging spectroscopy for geologic material identification: analysis of noise effects
Sgavetti,M.A. ; Gaibazzi,A. ; Longhi,I. ; Meli,S. ; Giardino,C. ; Capelletti,R. ; Baraldi,A. ; Crotti,M.
出版情報: Remote sensing for environmental monitoring, GIS applications, and geology : 18-21 September 2001, Toulouse, France.  pp.184-195,  2001.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4545
3.

国際会議録
国際会議録
3. Novel neural network model combining radial basis function,competitive Hebbian learning rule,and fuzzy simplified adaptive resonance theory (Invited Paper)
Baraldi,A. ; Parmiggiani,F.
出版情報: Applications of soft computing : 28-29 July 1997, San Diego, California.  pp.98-112,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3165
4.

国際会議録
国際会議録
4. Neural techniques for SAR intensity and coherence data classification
Blonda,P. ; Satalino,G. ; Wasowski,J. ; Parise,M. ; Baraldi,A. ; Refice,A.
出版情報: Image and signal processing for remote sensing V : 22-24 September 1999, Florence, Italy.  pp.374-381,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3871
5.

国際会議録
国際会議録
5. Reduction of Spatial Correlations Amongst DX Charges Owing to Capture of Photoexcited Electrons into a Localized Donor State in Al0.35Ga0.65As
Baraldi,A. ; Colonna,F. ; Ghezzi,C. ; Parisini,A.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1129-1134,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
6.

国際会議録
国際会議録
6. Experimental comparison of FOSART and FLVQ in a remotely sensed image classification task (Invited Paper)
Blonda,P. ; Baraldi,A. ; Bafunno,G. ; Satalino,G. ; Ria,G.
出版情報: Applications of soft computing : 28-29 July 1997, San Diego, California.  pp.113-122,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3165
7.

国際会議録
国際会議録
7. Fuzzy clustering:critical analysis of the contextual mechanisms employed by three neural network models
Baraldi,A. ; Parmiggiani,F.
出版情報: Applications of fuzzy logic technology III : 10-12 April, 1996, Orlando, Florida.  pp.261-270,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2761