1.

国際会議録
国際会議録
1. Advanced imaging sensors at Rockwell Scientific Company (Invited Paper)
Montroy, J.T. ; Garnett, J.D. ; Cabelli, S.A. ; Loose, M. ; Joshi, A.B. ; Hughes, G.W. ; Kozlowski, L.J. ; Haas, A.K. ; Wong, S.S. ; Zandian, M. ; Chen, A.C. ; Pasko, J.G. ; Farris, M.C. ; Cabelli, C.A. ; Cooper, D.E. ; Arias, J.M. ; Bajaj, J. ; Vural, K.
出版情報: Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA.  pp.212-226,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4721
2.

国際会議録
国際会議録
2. Device analysis of MBE HgCdTe p-on-n photovoltaic detectors in 5- to 15-μm wavelength range
Wijewarnasuriya, P.S. ; Dhar, N.K. ; D'Souza, A.I. ; Stapelbroek, M.G. ; Edwall, D.D. ; Arias, J.M. ; Bajaj, J.
出版情報: Infrared Technology and Applications XXX.  pp.230-238,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5406