1.

国際会議録
国際会議録
1. Vacancy Type Defects After Post Growth Quenching and Re-Anneajing of Si GaAs
Clayton,J.M. ; Fretwell,H. ; Usmar,S.C. ; Alam,A. ; Hlurle,D.T.J.
出版情報: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.2  pp.929-932,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 105-110
2.

国際会議録
国際会議録
2. Positron Studies of Vacancy Migration Behaviour in Quenched Nickel
Beasley,P. ; West,R.N. ; Alam,A.
出版情報: Vacancies and interstitials in metals and alloys : Proceedings of the International Conference on Vacancies and Interstitials in Metals and Alloys held in Berlin, Germany, September 14-19, 1986.  Pt.1  pp.175-180,  1987.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 15-18
3.

国際会議録
国際会議録
3. Positron Studies of the Recovery Behaviour of Quenched and Deformed Gold
Beasley,P. ; Alam,A. ; West,R.N.
出版情報: Vacancies and interstitials in metals and alloys : Proceedings of the International Conference on Vacancies and Interstitials in Metals and Alloys held in Berlin, Germany, September 14-19, 1986.  Pt.1  pp.169-174,  1987.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 15-18
4.

国際会議録
国際会議録
4. Positron Studies of Solute Clustering in Al-Ag Alloys
Fretwell,H. ; Usmar,S. ; Alam,A. ; Dlubek,G.
出版情報: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.2  pp.1013-1016,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 105-110
5.

国際会議録
国際会議録
5. Silicon as a substrate in multiwafer MOVPE GaN technology
Alam,A. ; Schineller,B. ; Protzmann,H. ; Lunenburger,M. ; Heuken,M. ; Bremser,M.D. ; Woelk,E. ; Dadgar,A. ; Krost,A.
出版情報: Light-Emitting Diodes: Research, Manufacturing, and Applications V.  pp.158-164,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4278