1.

国際会議録
国際会議録
1. Manufacturing of linear variable filters with straight iso-thickness lines [5963-11]
Abel-Tiberini, L. ; Lematquis, F. ; Marchand, G. ; Roussel, L. ; Albrand, G. ; Lequime, M.
出版情報: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.59630B-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5963
2.

国際会議録
国際会議録
2. Spatially resolved spectroscopy for non-uniform thin film coatings: comparison of two dedicated set-ups [5965-70]
Krasilnikova, A. ; Piegari, A. ; Dami, M. ; Abel-Tiberini, L. ; Lemarquis, F. ; Lequime, M.
出版情報: Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany.  pp.59651V-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5965
3.

国際会議録
国際会議録
3. Recent progress in mid-infrared integrated optics for nulling interferometry [6268-90]
Labaie, L. ; Abel-Tiberini, L. ; LeCoarer, E. ; Vigreux-Bercovici, C. ; Arezki, B. ; Barillot, M. ; Broquin, J -E. ; Delboulbe, A. ; Kem, P. ; Kirschner, V. ; Labeye, P. ; Pradel, A. ; Ruilier, C ; Saguet, P.
出版情報: Advances in Stellar Interferometry.  pp.62682E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6268