Cutting Temperature Measurements of Segmented Chips Using Dual-Spectrum High-Speed Microvideography.

Cutting Temperature Measurements of Segmented Chips Using Dual-Spectrum High-Speed Microvideography.

著者名:

掲載資料名:

S.M.E. technical paper

シリーズ名:

SME Technical Paper : TP

シリーズ巻号:

2008

発行年:

2008

通号:

TP08PUB052

ペーパー番号:

TP08PUB052

総ページ数:

8

出版情報:

Dearborn, Mich.: Society of Manufacturing Engineers

言語:

英語

請求記号:

S42600

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00052159
シリーズID:	PA00000134
論文注記:	NAMRC 2008, Monterrey, Mexico, 2008.05.20-2008.05.23

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