Automated Instrument Panel Cluster Testing using Hardware in the Loop Simulators.

Automated Instrument Panel Cluster Testing using Hardware in the Loop Simulators.

著者名:

掲載資料名:

2008 SAE world congress : technical paper

シリーズ名:

Society of Automotive Engineers technical paper series

シリーズ巻号:

2008

発行年:

2008

通号:

2008-01-1223

ペーパー番号:

2008-01-1223

総ページ数:

10

出版情報:

Warrendale, Penn.: Society of Automotive Engineers

ISSN:

01487191

言語:

英語

請求記号:

S10400

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00052084
シリーズID:	PA00000058
会議名:	SAE World Congress
回次:	2008
会議開催地:	Detroit, Michigan, USA
会議開催年:	2008.04.14-2008.04.17
論文注記:	SAE 2008 World Congress, April 14-17, 2008, Detroit, Michigan, USA

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