Applicability of Phase Ray-Tracing Method for Light Scattering from Rough Surfaces

Applicability of Phase Ray-Tracing Method for Light Scattering from Rough Surfaces

著者名:

H. Lee ( Georgia Institute of Technology, Atlanta, GA )
Z. Zhang

掲載資料名:

AIAA meeting papers on disc

シリーズ名:

AIAA Paper : AIAA/ASME Joint Thermophysics and Heat Transfer Conference

シリーズ巻号:

2006

発行年:

2006

通号:

2006-3432

ペーパー番号:

AIAA Paper 2006-3432

出版情報:

Reston, Va: American Institute of Aeronautics and Astronautics

ISSN:

10877215

言語:

英語

請求記号:

A07400/200613 [CD-ROM Disc 13]

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00047239
シリーズID:	PA00000169
会議名:	AIAA/ASME Joint Thermophysics and Heat Transfer Conference
回次:	9th
会議開催地:	San Francisco, California
会議開催年:	2006.06.05-2006.06.08

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