Virtual Key Life Tests of Instrument Panels for Product Development.

Virtual Key Life Tests of Instrument Panels for Product Development.

著者名:

掲載資料名:

2004 SAE world congress : technical paper

シリーズ名:

Society of Automotive Engineers technical paper series

シリーズ巻号:

2004

発行年:

2004

通号:

2004-01-1482

ペーパー番号:

2004-01-1482

総ページ数:

7

出版情報:

Warrendale, Penn.: Society of Automotive Engineers

ISSN:

01487191

言語:

英語

請求記号:

S10400

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00001658
シリーズID:	PA00000058
会議名:	SAE World Congress, 2004
回次:	2004
会議開催地:	Detroit, Michigan, USA
会議開催年:	2004.03.08-2004.03.11
論文注記:	SAE World Congress, 2004, Detroit, Michigan, 8-11 March, 2004; Reprinted From: Advances in Interiors and Instrument Panels, SP-1848

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