Overview of Diagnostics for the NEXT Long Duration Test

Overview of Diagnostics for the NEXT Long Duration Test

著者名:

Hickman, T. ( NASA Glenn Research Center, Cleveland, OH )
Arrington, L. ( QSS Group, Inc., Brook Park, OH )
Frandina, M.
Soulas, G. ( NASA Glenn Research Center, Cleveland, OH )

掲載資料名:

AIAA meeting papers on disc

シリーズ名:

AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit

シリーズ巻号:

41st

発行年:

2005

通号:

2005-4064

ペーパー番号:

AIAA Paper 2005-4064

出版情報:

[Reston, Va.]: American Institute of Aeronautics and Astronautics

ISSN:

10877215

言語:

英語

請求記号:

A07400/200514 [CD-ROM 2005 Disc 14]

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00001634
シリーズID:	PA00000151
会議名:	AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
回次:	41st
会議開催地:	Tucson, Arizona
会議開催年:	2005.07.10-2005.07.13

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