Nano-Particle Image Velocimetry (NPIV): A New Technique for Measuring Near-Wall Velocity Fields with Submicron Spatial Resolution

Nano-Particle Image Velocimetry (NPIV): A New Technique for Measuring Near-Wall Velocity Fields with Submicron Spatial Resolution

著者名:

Yoda, M. ( Georgia Institute of Technology, Atlanta, GA )
Sadr, R.

掲載資料名:

AIAA meeting papers on disc

シリーズ名:

AIAA Paper : Aerospace Sciences Meeting and Exhibit

シリーズ巻号:

42nd

発行年:

2004

通号:

2004-0754

ペーパー番号:

AIAA-2004-754

出版情報:

[Reston, Va.]: American Institute of Aeronautics and Astronautics

ISSN:

10877215

言語:

英語

請求記号:

A07400/200403 [CD-ROM 2004 Disc 3]

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00001599
シリーズID:	PA00000138
会議名:	AIAA Aerospace Sciences Meeting and Exhibit
回次:	42nd
会議開催地:	Reno, Nevada
会議開催年:	2004.01.05-2004.01.08

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