Electronic Structure of HgBa2CaCu2O(6+delta) Epitaxial films measured by x-ray Photoemission

Electronic Structure of HgBa2CaCu2O(6+delta) Epitaxial films measured by x-ray Photoemission

著者名:

Vasquez, R. P. ( Jet Propulsion Lab. )
Rupp, M. ( IBM Watson Research Center )
Gupta, A. ( IBM Watson Research Center )
Tsuei, C. C. ( IBM Watson Research Center )

掲載資料名:

NASA Technical Reports

発行年:

1995

巻:

19970009639

号:

NASA-CR-203122

パート:

NAS 1.26:203122

開始ページ:

1

終了ページ:

8

総ページ数:

8

出版情報:

National Aeronautics and Space Adminstration

言語:

英語

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:

ZA00001434

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