Characterization Of Metallic Multilayers Using X-Ray Diffraction Analysis | 東京工業大学附属図書館文献データベース

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Characterization Of Metallic Multilayers Using X-Ray Diffraction Analysis

著者名:

Alyan, Saad mohamed Harb ( National Institute for Aviation Research )
Chaudhuri, Jharna ( The Sichita State University )

掲載資料名:

NASA Technical Reports

発行年:

1993

通号:

H2/26 0193189

ペーパー番号:

N94-17282

開始ページ:

1

終了ページ:

87

総ページ数:

87

出版情報:

National Aeronautics and Space Adminstration

言語:

英語

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:

ZA00001430

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