X ray attenuation measurements for high-temperature materials characterization and in-situ monitoring of damage accumulation | 東京工業大学附属図書館文献データベース

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X ray attenuation measurements for high-temperature materials characterization and in-situ monitoring of damage accumulation

著者名:: Baaklini, George Y. ( NASA Lewis Research Center )
掲載資料名:: NASA Technical Reports
発行年:: 1992
号:: NASA-TM-105677
通号:: G3/24 0092886
パート:: NAS 1.15:105677
ペーパー番号:: N92-26686
開始ページ:: 1
終了ページ:: 221
総ページ数:: 221
出版情報:: National Aeronautics and Space Adminstration
言語:: 英語
資料種別:: テクニカルペーパー

詳細

TDL書誌ID:

ZA00001428

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