Study of InGaAs Based MODEFET Structures Using Variable Angle Spectroscopic Ellipsometry

Study of InGaAs Based MODEFET Structures Using Variable Angle Spectroscopic Ellipsometry

著者名:

Alterovitz, S.A. ( Lewis Research Center )

Sieg, R.M. ( Cleveland State University )

Yao, H.D. ( University of Nebraska )

Snyder, P.G.

Woollam, J.A.

Pamulapati, J. ( University of Michigan )

Bhattacharya, P.K.

Sekula-Moise, P.A. ( Spire Corporation )

さらに 3 件

掲載資料名:

NASA Technical Reports

発行年:

1991

号:

NASA-TM-103792

パート:

NAS 1.15:103792

ペーパー番号:

N91-19935

開始ページ:

1

終了ページ:

13

総ページ数:

13

出版情報:

National Aeronautics and Space Adminstration

言語:

英語

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:

ZA00001427

類似資料:

1 テクニカルペーパー Dielectric Function of InGaAs in the Visible Alterovitz, S.A., Sieg, R.E., Yao, H.D., Snyder, P.G., Woollam, J.A., Pamulapati, J., Bhattacharya, P.K., Sekula-Moise, … National Aeronautics and Space Adminstration	7 国際会議録 VARIABLE ANGLE OF INCIDENCE SPECTROSCOPIC ELLIPSOMETRIC MEASUREMENT OF THE FRANZ-KELDYSH EFFECT IN MODFET STRUCTURES Snynder, P.G., Oh, J.E., Woollam, J.A. Materials Research Society
2 テクニカルペーパー Ellipsometric Study of InGaAs MODFET Material Alterovitz, S.A., Sieg, R.E., Yao, H.D., Snyder, P.G., Woollam, J.A., Pamulapati, J., Bhattacharya, P.K. National Aeronautics and Space Adminstration	8 国際会議録 CHARACTERIZATION OF POLYSILICON THIN FILMS BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY Ziong, Yi-Ming, Snyder, Paul G., Woollam, John A., Krosche, Eric R., Strausser, Yale Materials Research Society
3 国際会議録 VARIABLE ANGLE OF INCIDENCE SPECTROSCOPIC ELLIPSOMETRIC STUDY OF SEMICONDUCTOR MULTILAYER STRUCTURES Snyder, P.G., Woollam, J.A., Alterovitz, S.A. Materials Research Society	9 国際会議録 Variable angle spectroscopic ellipsometry studies of HgI2 Yao, Huade, Johs, Blaine MRS - Materials Research Society
4 国際会議録 SUPERLATTICE OPTICAL PROPERTIES MEASURED BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY Snyder, P. G., Merkel, K. G., De, B. N., Woollam, J. A., Langer, D. W., Stutz, C. E., Jones, R., Rai, A. K., Evans, K. Materials Research Society	10 国際会議録 GaAs(100) SURFACE MODIFICATIONS AT ELEVATED TEMPERATURES, STUDIED BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY Yao, Huade, Snyder, Paul G., Woollam, John A. Materials Research Society
5 国際会議録 STUDY OF ION IMPLANTED COPPER LASER MIRRORS BY SPECTROSCOPIC ELLIPSOMETRY Snyder, P.G., Massengale, A., Memarzadeh, K., Woollam, J.A., Ingram, D.C., Pronko, P.P. Materials Research Society	11 国際会議録 CHARACTERIZATION OF AN ASYMMETRIC TRIANGULAR MULTIPLE QUANTUM WELL, BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY Herzinger, Craig M., Snyder, Paul G., Woollam, John A., Evans, Keith, Stutz, C.E., Jones, R., Merkel, K.G., Reynolds, … Materials Research Society
6 国際会議録 *VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE FOR THE STUDY OF ION-BEAM -AND GROWTH MODIFIED SOLIDS Woollam, John A., Snyder, Paul G., Rost, M. C. Materials Research Society	12 国際会議録 Optical Dielectric Response of Gallium Nitride Studied by Variable Angle Spectroscopic Ellipsometry Yao, H., Yan, C. H., Jenkinson, H. A., Zavada, J. M., Speck, J. S., DenBaars, S. P. MRS - Materials Research Society

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