High Temperature Reliability Assessment and Degradation Analysis for Diamond Semiconductor Devices

High Temperature Reliability Assessment and Degradation Analysis for Diamond Semiconductor Devices

著者名:

S. Tanimoto

掲載資料名:

Silicon Carbide and Related Materials 2016

シリーズ名:

Materials science forum

シリーズ巻号:

897

発行年:

2017

開始ページ:

743

終了ページ:

746

総ページ数:

4

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9783035710434 [3035710430]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00066569
シリーズID:	PA00000012
会議名:	ECSCRM
回次:	2016
会議開催地:	Halkidiki, Greece
会議開催年:	2016.09.25-2016.09.29
論文注記:	ECSCRM 2016, 25-29 September, 2016, Halkidiki, Greece

類似資料:

1 国際会議録 Electromigration Reliability of the Contact Hole in SiC Power Devices Operated at Higher Junction Temperatures S. Tanimoto, N. Nishio, T. Suzuki, Y. Murakami, H. Ohashi Trans Tech Publications	7 国際会議録 Electron Emission from Diamond (111) p⁺-i-n⁺ Junction Diode Daisuke Takeuchi, Toshiharu Makino, Hiromitsu Kato, Masahiko Ogura, Norio Tokuda, Kazuhiro Oyama, Tsubasa Matsumoto, … Materials Research Society
2 国際会議録 A Built-In High Temperature Half-Bridge Power Module with Low Stray Inductance and Low Thermal Resistance for In-Wheel Motor Application T. Suzuki, M. Yamashita, T. Mori, S. Araki, S. Tanimoto, S. Iizuka, Y. Niitsuma, K. Akatsu Trans Tech Publications	8 国際会議録 Light-Emitting Devices Based on Gallium Nitride and Related Compound Semiconductors Koike, M., Shibata, N., Yamasaki, S., Nagai, S., Asami, S., Kato, H., Koide, N., Amano, H., Akasaki, I. MRS - Materials Research Society
3 国際会議録 Critical Reliability Issues for SiC Power MOSFETs Operated at High Temperature S. Tanimoto, T. Suzuki, A. Hanamura, M. Hoshi, T. Shinohara, K. Arai Trans Tech Publications	9 国際会議録 High-Reliability ONO Gate Dielectric for Power MOSFETs Tanimoto, S., Tanaka, H., Hayashi, T., Shimoida, Y., Hoshi, M., Mihara, T. Trans Tech Publications
4 国際会議録 Impact of Dislocations on Gate Oxide in SiC MOS Devices and High Reliability ONO Dielectrics Tanimoto, S. Trans Tech Publications	10 国際会議録 GaN-based MQW Light-emitting devices Koike,M., Yamasaki,S., Tezen,Y., Nagai,S., Iwayama,S., Kojima,A., Uemura,T., Hirano,A., Kato,H. SPIE - The International Society for Optical Engineering
5 国際会議録 High-temperature reliability of GaN electronic devices Yoshida, S., Suzuki, J. MRS-Materials Research Society	11 国際会議録 n-Type Diamond Growth by Phosphorus Doping Hiromitsu Kato, Toshiharu Makino, Satoshi Yamasaki, Hideyo Okushi Materials Research Society
6 国際会議録 Negative Field Reliability of ONO Gate Dielectric on 4H-SiC S. Tanimoto, T. Suzuki, S. Yamagami, H. Tanaka, T. Hayashi Trans Tech Publications	12 国際会議録 Toward a Better Understanding of Ni-Based Ohmic Contacts on SiC S. Tanimoto, M. Miyabe, T. Shiiyama, T. Suzuki, H. Yamaguchi Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12