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Physical Characterisation of 3C-SiC(001)/SiO2 Interface Using XPS

著者名:
F. Li
O. Vavasour
M. Walker
D.M. Martin
Y.K. Sharma
S.A.O. Russell
M.R. Jennings
A. Pérez-Tomás
P.A. Mawby
さらに 4 件
掲載資料名:
Silicon Carbide and Related Materials 2016
シリーズ名:
Materials science forum
シリーズ巻号:
897
発行年:
2017
開始ページ:
151
終了ページ:
154
総ページ数:
4
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710434 [3035710430]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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