Blank Cover Image

Optical integrated testing instrument for pipe interior parameter measurement and inspection

著者名:
掲載資料名:
Three-dimensional and unconventional imaging for industrial inspection and metrology : 23-25 October 1995, Philadelphia, Pennsylvania
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2599
発行年:
1996
開始ページ:
400
終了ページ:
405
総ページ数:
6
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419637 [081941963X]
言語:
英語
請求記号:
P63600/2599
資料種別:
国際会議録

類似資料:

L. Wu, B. Zhang, P. Wu, Q. Liu, H. Gong

SPIE - The International Society of Optical Engineering

Sun Z., Peng Z., Liu H., Xie Y., Jing F., Wu D.

SPIE - The International Society of Optical Engineering

Zhang, Y. B., Chen, S. W., Liu, C. J., Sun, Y. H., Sun, M. C., Wang, R. K.

Trans Tech Publications

Zhang, Z.X., Liu, H.L., Guo, N., Wang, J.F., Wu, X.B., Yu, X.D., Feng, H.Q., Kim, I.S.

SPIE-The International Society for Optical Engineering

Zhang, Z., Zhang, H., Gong, Z., Ye, L., Lan, J., Li, X.

SPIE - The International Society of Optical Engineering

Zhang J., Sun Z., Wang D., Wang Y., Wu C.

SPIE - The International Society of Optical Engineering

Y. Zhang, Y. Wu, H. Liu, J. C. Lambropoulos

SPIE - The International Society of Optical Engineering

H. Hao, B. Li, M. Liu, Y. Gong

Society of Photo-optical Instrumentation Engineers

Z. Zhang, J. Liu, Y. Liu

Society of Photo-optical Instrumentation Engineers

Chen, H., Wang, B., Luo, X., Liu, Z., Ding, J., Zhu, J.

SPIE-The International Society for Optical Engineering

K. Wu, H. Zhang, M.Y. Xia, J.T. Wu, X.B. Liu

Trans Tech Publications

S.-B. Liu, H.-F. Yu

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12