Optimizing the performance of near-perfect defect detection machines

Optimizing the performance of near-perfect defect detection machines

著者名:: W. Pölzleitner
掲載資料名:: Machine vision applications, architectures, and systems integration IV : 23-24 October, 1995, Philadelphia, Pennsylvania
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 2597
発行年:: 1995
開始ページ:: 178
終了ページ:: 188
総ページ数:: 11
出版情報:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:: 0277786X
ISBN:: 9780819419613 [0819419613]
言語:: 英語
請求記号:: P63600/2597
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00057793
シリーズID:	PA00000029
会議名:	Symposium on machine vision applications, architectures, and systems integration
回次:	4th
会議開催地:	Philadelphia, PA, USA
会議開催年:	1995.10.23-1995.10.24
論文注記:	4th Symposium on machine vision applications, architectures, and systems integration, October 23-24, 1995, Philadelphia, PA, USA. 2597-24

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