Blank Cover Image

Performance metrics for point target detection in consecutive frame IR imagery

著者名:
掲載資料名:
Signal and data processing of small targets 1995 : 11-13 July 1995, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2561
発行年:
1995
開始ページ:
25
終了ページ:
30
総ページ数:
6
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419200 [0819419206]
言語:
英語
請求記号:
P63600/2561
資料種別:
国際会議録

類似資料:

C.E. Caefer, J.M. Mooney, J. Silverman

Society of Photo-optical Instrumentation Engineers

Caefer,C.E., Silverman,J., DiSalvo,S., Taylor,R.W.

SPIE - The International Society for Optical Engineering

Caefer,C.E., Silverman,J., Mooney,J.M., DiSalvo,S., Taylor,R.W.

SPIE-The International Society for Optical Engineering

Silverman,J., Caefer,C.E., Mooney,J.M., Weeks,M.M., Yip,P.

SPIE-The International Society for Optical Engineering

Silverman,J., Mooney,J.M., Caefer,C.E.

SPIE-The International Society for Optical Engineering

Simson, Y., Cohen, M., Rotman, S.R., Caefer, C.E.

SPIE - The International Society of Optical Engineering

Silverman,J., Caefer,C.E., DiSalvo,S., Vickers,V.E.

SPIE-The International Society for Optical Engineering

Silverman, J., Rotman, S.R., Duseau, K.L., Caefer, C.E.

SPIE - The International Society of Optical Engineering

Caefer, C.E., Rotman, S.R., Silverman, J., Yip, P.W.

SPIE-The International Society for Optical Engineering

Silverman, J., Rotman, S.R., Caefer, C.E.

SPIE-The International Society for Optical Engineering

Silverman, Jerry, Mooney, Jonathan M., Caefer, Charlene E.

SPIE

Parshall,E.R., Mooney,J.M., Anselmo,A.P.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12