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Nondestructive characterization of Ti-doped and V-doped CdTe by time-dependent charge measurement

著者名:
掲載資料名:
Growth and characterization of materials for infrared detectors II : 13-14 July, 1995, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2554
発行年:
1995
開始ページ:
265
終了ページ:
268
総ページ数:
4
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419132 [0819419133]
言語:
英語
請求記号:
P63600/2554
資料種別:
国際会議録

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