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Two-wavelength laser diode interferometry with one phase meter

著者名:
掲載資料名:
Interferometry VII : techniques and analysis : 11-12 July 1995, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2544
発行年:
1995
開始ページ:
148
終了ページ:
156
総ページ数:
9
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419033 [0819419036]
言語:
英語
請求記号:
P63600/2544
資料種別:
国際会議録

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