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Resistivity and deep-level investigations of detector-grade CdTe: a comparison of different growth techniques

著者名:
掲載資料名:
X-ray and ultraviolet sensors and applications : 13-14 July 1995, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2519
発行年:
1995
開始ページ:
127
終了ページ:
134
総ページ数:
8
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418784 [0819418781]
言語:
英語
請求記号:
P63600/2519
資料種別:
国際会議録

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