Advanced X-ray Astrophysics Facility (AXAF): an overview

Advanced X-ray Astrophysics Facility (AXAF): an overview

著者名:

掲載資料名:

X-ray and extreme ultraviolet optics : 9-11 July 1995, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2515

発行年:

1995

開始ページ:

312

終了ページ:

329

総ページ数:

18

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418746 [0819418749]

言語:

英語

請求記号:

P63600/2515

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057717
シリーズID:	PA00000029
会議名:	Symposium on X-ray and extreme ultraviolet optics
回次:	1995
会議開催地:	San Diego, CA, USA
会議開催年:	1995.07.09-1995.07.11
論文注記:	1995 Symposium on X-ray and extreme ultraviolet optics, July 9-11, 1995, San Diego, CA, USA. 2515-36

類似資料:

1 国際会議録 Advanced X-Ray Astrophysics Facility(AXAF) Weisskopf,M.C., O'Dell,S.L., Speybroeck,L.P.Van SPIE-The International Society for Optical Engineering	7 国際会議録 On the use of monochromators during AXAF calibration Swartz, D.A., Elsner, R.F., Kolodziejczak, J.J., O'Dell, S.L., Tennant, A.F., Sulkanen, M.E., Weisskopf, M.C., Edgar, … SPIE
2 国際会議録 Advanced X-ray Astrophysics Facility (AXAF): calibration overview O'Dell, S.L., Weisskopf, M.C. SPIE	8 国際会議録 Uses of continuum radiation in the AXAF calibration Kolodziejczak,J.J., Austin,R.A., Elsner,R.F., O'Dell,S.L., Sulkanen,M.E., Swartz,D.A., Tennant,A.F., Weisskopf,M.C., … SPIE-The International Society for Optical Engineering
3 国際会議録 Shielding simulations for the Advanced X-Ray Astrophysics Facility (AXAF) K.L. Dietz, R.F. Elsner, M.K. Joy, S.L. O'Dell, B.D. Ramsey Society of Photo-optical Instrumentation Engineers	9 国際会議録 Calibration results for the AXAF flight contamination monitor Elsner, R.F., O'Dell, S.L., Ramsey, B.D., Tennant, A.F., Weisskopf, M.C., Kolodziejczak, J.J., Swartz, D.A., Engelhaupt, … SPIE
4 国際会議録 Calibration of the AXAF observatory: overview Weisskopf,M.C., O'Dell,S.L. SPIE-The International Society for Optical Engineering	10 国際会議録 Development of hard x-ray optics at MSFC Ramsey, B.D., Elsner, R.F., Engelhaupt, D.E., O'Dell, S.L., Speegle, C.O., Weisskopf, M.C. SPIE-The International Society for Optical Engineering
5 国際会議録 Absolute calibration of the AXAF telescope effective area Kellogg,E.M., Cohen,L.M., Edgar,R.J., Evans,I.N., Freeman,M.D., Gaetz,T.J., Jerius,D., McDermott,W.C., McKinnon,P.J., … SPIE-The International Society for Optical Engineering	11 国際会議録 Measurements with the Chandra X-Ray Observatory's flight contamination monitor Elsner,R.F., Kolodziejczak,J.J., O'Dell,S.L., Swartz,D.A., Tennant,A.F., Weisskopf,M.C. SPIE-The International Society for Optical Engineering
6 国際会議録 Chandra X-ray Observatory(CXO):overview Weisskopf,M.C., Tananbaum,H.D., Speybroeck,L.P.Van, O'Dell,S.L. SPIE - The International Society for Optical Engineering	12 国際会議録 Measurements with the Chandra X-ray Observatory's flight contamination monitor Elsner,R.F., Kolodziejczak,J.J., O'Dell,S.L., Swartz,D.A., Tennant,A.F., Weisskopf,M.C. SPIE - The International Society for Optical Engineering

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