Blank Cover Image

Systematic errors in high-precision optical interferometric astrometry

著者名:
M.C. Noecker  
掲載資料名:
Spaceborne interferometry II: 19-20 April 1995, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2477
発行年:
1995
開始ページ:
188
終了ページ:
208
総ページ数:
21
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418302 [0819418307]
言語:
英語
請求記号:
P63600/2477
資料種別:
国際会議録

類似資料:

P. B. Cameron, M. C. Britton, S. R. Kulkarni

Society of Photo-optical Instrumentation Engineers

Turyshev,S.G.

SPIE-The International Society for Optical Engineering

Noecker, M.C., Linfield, R., Miller, D., Osterman, D., Kilston, S., Lieber, M., Babb, B., Cavender, A., Jacobs, J.

SPIE - The International Society of Optical Engineering

Noecker, M.C., Lay, O.P., Ware, B., Dubovitsky, S.

SPIE - The International Society of Optical Engineering

S. C. Unwin, M. Shao, S. J. Edberg

Society of Photo-optical Instrumentation Engineers

M. H. Milman, D. Murphy

Society of Photo-optical Instrumentation Engineers

Kilston, S., Noecker, M.C.

ESA Publications Division

Armstrong, J. T., Clark III, J. H., Gilbreath, G. C., Hindsley, R. B., Hutter, D. J., Mozurkewich, D., Pauls, T. A.

SPIE - The International Society of Optical Engineering

Noecker,M.C., Leitch,J.W., Kopp,G.A., McComas,B.K.

SPIE - The International Society for Optical Engineering

Gardiol, D., Loreggia, D., Mannu, S., Mottini, S., Perachino, L., Gai, M., Lattanzi, M. G.

SPIE - The International Society of Optical Engineering

II, N.M.E., Noecker, M.C.

SPIE - The International Society of Optical Engineering

Vogt,M.C.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12