Test methodologies for linear longwave infrared detector array production

Test methodologies for linear longwave infrared detector array production

著者名:

掲載資料名:

Smart focal plane arrays and focal plane array testing : 17-18 April 1995, Orlando, Florida

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2474

発行年:

1995

開始ページ:

283

終了ページ:

294

総ページ数:

12

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418272 [0819418277]

言語:

英語

請求記号:

P63600/2474

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057676
シリーズID:	PA00000029
会議名:	Symposium on smart focal plane arrays and focal plane array testing
回次:	1995
会議開催地:	Orlando, FL, USA
会議開催年:	1995.04.17-1995.04.18
論文注記:	1995 Symposium on smart focal plane arrays and focal plane array testing, April 17-18, 1995, Orlando, FL, USA. 2474-29

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