Polarization contrast in scanning microscopy

Polarization contrast in scanning microscopy

著者名:

掲載資料名:

Three-dimensional microscopy : image acquisition and processing II : 9-10 February 1995, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2412

発行年:

1995

開始ページ:

74

終了ページ:

79

総ページ数:

6

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819417596 [0819417599]

言語:

英語

請求記号:

P63600/2412

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057615
シリーズID:	PA00000029
会議名:	Symposium on three-dimensional microscopy
回次:	2nd
会議開催地:	San Jose, CA, USA
会議開催年:	1995.02.09-1995.02.10
論文注記:	2nd Symposium on three-dimensional microscopy, February 9-10, 1995, San Jose, CA, USA. 2412-10

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