Imaging adhesion forces on proteins with the atomic force microscope
- 著者名:
- 掲載資料名:
- Scanning probe microscopies III : 6-7 February 1995, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2384
- 発行年:
- 1995
- 開始ページ:
- 136
- 終了ページ:
- 143
- 総ページ数:
- 8
- 出版情報:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819417312 [0819417319]
- 言語:
- 英語
- 請求記号:
- P63600/2384
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
8
国際会議録
Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
American Chemical Society |
Kluwer Academic Publishers |