Residual stress analysis in an annular plate based on experimental data obtained from different techniques

Residual stress analysis in an annular plate based on experimental data obtained from different techniques

著者名:

掲載資料名:

Interferometry '94 : photomechanics : 16-20 May 1994, Warsaw, Poland

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2342

発行年:

1994

開始ページ:

265

終了ページ:

272

総ページ数:

8

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819416759 [0819416754]

言語:

英語

請求記号:

P63600/2342

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057545
シリーズID:	PA00000029
会議名:	Interferometry
回次:	1994
会議開催地:	Warsaw, Poland
会議開催年:	1994.05.16-1994.05.20
論文注記:	1994 Interferometry, May 16-20, 1994, Warsaw, Poland. 2342-32

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