Copper interconnection schemes: elimination of the need of diffusion barrier/adhesion promoter by the use of corrosion-resistant low-resistivity-doped copper
- 著者名:
- 掲載資料名:
- Microelectronics technology and process integration : 20-21 October 1994, Austin, Texas
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2335
- 発行年:
- 1994
- 開始ページ:
- 80
- 終了ページ:
- 90
- 総ページ数:
- 11
- 出版情報:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819416681 [0819416681]
- 言語:
- 英語
- 請求記号:
- P63600/2335
- 資料種別:
- 国際会議録
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1
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