Submicrometer Scale Hybrid Patterning from Soft Lithography and Self-Assembly of Block Copolymer and Colloidal Particles

Submicrometer Scale Hybrid Patterning from Soft Lithography and Self-Assembly of Block Copolymer and Colloidal Particles

著者名:

掲載資料名:

Nanotechnology Topical Conference : 2003 AIChE Annual Meeting, San Francisco, California, November 16-21, 2003

シリーズ名:

AIChE Conference Proceedings

シリーズ巻号:

P-201(TC)

発行年:

2003

開始ページ:

139d

総ページ数:

1

出版情報:

New York: American Institute of Chemical Engineers

ISBN:

9780816909414 [0816909415]

言語:

英語

請求記号:

A08000/2003 [CD-ROM]

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00061150
シリーズID:	PA00000008
会議名:	Nanotechnology Topical Conference ; AIChE Annual Meeting
回次:	2003
会議開催地:	San Francisco, CA, USA
会議開催年:	2003.11.16-2003.11.21
論文注記:	Nanotechnology Topical Conference, 2003 AIChE Annual Meeting, San Francisco, California, November 16-21, 2003

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