Blank Cover Image

Low Resistivity SiC Devices with a Drift Layer Optimized by Variational Approach

著者名:
掲載資料名:
Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy
シリーズ名:
Materials science forum
シリーズ巻号:
858
発行年:
2016
開始ページ:
765
終了ページ:
768
総ページ数:
4
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710427 [3035710422]
言語:
英語
請求記号:
M23650 [v.858]
資料種別:
国際会議録

類似資料:

T. Tanaka, N. Kawabata, Y. Mitani, N. Tomita, M. Tarutani

Trans Tech Publications

R. Rupp, W. Schustereder, T. Höechbauer, R. Kern, M. Rüb

Trans Tech Publications

N. Watanabe, H. Yoshimoto, A. Shima, R. Yamada, Y. Shimamoto

Trans Tech Publications

Shibuichi,D., Tanaka,T., Terashima,N., Tominaga,H.

SPIE - The International Society for Optical Engineering

T. Tanaka, N. Kawabata, Y. Mitani, M. Sakai, N. Tomita

Trans Tech Publications

H. Watanabe, D. Ikeguchi, T. Kirino, S. Mitani, Y. Nakano

Trans Tech Publications

A. Tanaka, N. Kawabata, M. Tsujimura, Y. Furukawa, T. Hoshino

Trans Tech Publications

Y. Tanaka, M. Taoka, H. suzuki, F. Yanagawa, B. Cohen, H. Hanawa, T. Taniguchi, M. Togashi, K. Watanabe

Electrochemical Society

Watanabe,T., Kinoshita,H., Miyafuji,A., Irie,S., Shirayone,S., Mori,S., Yano,E., Hada,H., Ohmori,K., Komano,H.

SPIE - The International Society for Optical Engineering

Oka, K., Yamada, A., Komai, Y., Watanabe, E., Ebizuka, N., Teranishi, T., Kawabata, M., Kodate, K.

SPIE-The International Society for Optical Engineering

Shida, N., Watanabe, H., Yamazaki, T., Ishikawa, S., Toriumi, M., Itani, T.

SPIE-The International Society for Optical Engineering

Tominaga, S., Tanaka, N., Matsumoto, T.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12