Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

著者名:

掲載資料名:

International Conference on Residual Stresses 9 (ICRS 9) : Selected, peer reviewed papers from the 9th International Conference on Residual Stresses (ICRS 9), October 7-9, 2012, Garmisch-Partenkirchen, Germany

シリーズ名:

Materials science forum

シリーズ巻号:

768-769

発行年:

2014

開始ページ:

72

終了ページ:

75

総ページ数:

4

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00054246
シリーズID:	PA00000012
会議名:	International Conference on Residual Stresses (ICRS 9)
回次:	9th
会議開催地:	Garmisch-Partenkirchen, Germany
会議開催年:	2012.10.07-2012.10.09
論文注記:	9th International Conference on Residual Stresses (ICRS 9), October 7-9, 2012, Garmisch-Partenkirchen, Germany

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