Blank Cover Image

Influence of Repeated Tensile Stress on Determining the Critical Tensile Stress/Strain of Copper Reinforced Bi-2223/Ag Tapes

著者名:
掲載資料名:
Advances in Functional and Electronic Materials : Selected, peer reviewed papers from the Chinese Materials Congress 2012 (CMC 2012), July 13-18, 2012, Taiyuan, China
シリーズ名:
Materials science forum
シリーズ巻号:
745-746
発行年:
2013
開始ページ:
219
終了ページ:
224
総ページ数:
6
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

H.L. Zheng, X.Y. Xu, X.M. Xiong, G.Q. Liu, Q.B. Hao, C.S. Li, P.X. Zhang, Y.F. Lu

Trans Tech Publications

X.P. Chen, M. Liu, X.W. Yu, M.Y. Li

Trans Tech Publications

C.S. Li, E. Mossang, B. Bellin, A. Sulpice, A. Antonevici, P.X. Zhang

Trans Tech Publications

Z.M. Bai, C.L. Wu, H.L. Yang, J.X. Wang

Trans Tech Publications

X.Q. Huang, Z.Y. Lu, Y.F. He, J. Sun, J.X. Wang

Trans Tech Publications

Hu,X.F., Yang,J.L., Jiang,Z.Y., Wu,X.P., Wang,Z., Tian,Y.L., Huang,W.X.

SPIE-The International Society for Optical Engineering

Z.Y. Lu, X.Q. Huang, Y.F. He, J. Sun, J.X. Wang

Trans Tech Publications

H.S. Ha, S.C. Kim, D.W. Ha, S.S. Oh, J.H. Joo

Trans Tech Publications

Godfrey, A., Liu, W., Lin, D., Liu, Q.

Trans Tech Publications

J.Y. Li, H.L. Zheng, J.G. Li, C.S. Li, Y.F. Lu, L. Zhou

Trans Tech Publications

S. Ochiai, D. Doko, H. Okuda, S.S. Oh, D.W. Ha, M. Tanaka, M. Hojo, K. Osamura, M. Miura

Trans Tech Publications

Yang,J.L., Hu,X.F., Wu,X.P.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12