Dependence of the Surface Roughness and Localization Factor Parameters on the Background Correction of AFM Images: A Thin Film Characterization Study

Dependence of the Surface Roughness and Localization Factor Parameters on the Background Correction of AFM Images: A Thin Film Characterization Study

著者名:

掲載資料名:

Materials Science, Testing and Informatics VI : Selected, peer reviewed papers from the 8th Hungarian Conference on Materials Science, October 9-11, 2011, Balatonkenese, Hungary

シリーズ名:

Materials science forum

シリーズ巻号:

729

発行年:

2013

開始ページ:

193

終了ページ:

198

総ページ数:

6

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00054215
シリーズID:	PA00000012
会議名:	Hungarian Conference on Materials Science
回次:	8th
会議開催地:	Balatonkenese, Hungary
会議開催年:	2011.10.09-2011.10.11
論文注記:	8th Hungarian Conference on Materials Science, October 9-11, 2011, Balatonkenese, Hungary

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