Formation of Nanovoids in Femtosecond Laser-Irradiated Single Crystals of Silicon Carbide
- 著者名:
- 掲載資料名:
- Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 725
- 発行年:
- 2012
- 開始ページ:
- 19
- 終了ページ:
- 22
- 総ページ数:
- 4
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |
2
国際会議録
Electronic Properties of Femtosecond Laser Induced Modified Spots on Single Crystal Silicon Carbide
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |